Note: Grazing incidence small and wide angle x-ray scattering combined with imaging ellipsometry

Review of Scientific Instruments

Volumn 83, Issue 7, 2012, Pages

  Korstgens V ^a   Meier, R ^a   Ruderer, M A ^a   Guo, S ^a   Chiang, H Y ^a   Perlich, J ^b   Roth, S V ^b   Gehrke, R ^b   Muller Buschbaum P ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^b DESY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

GRAZING INCIDENCE; GRAZING INCIDENCE SMALL-ANGLE X-RAY SCATTERING; IMAGING ELLIPSOMETRY; MEASUREMENT TECHNIQUES; METHYL ESTERS; NEW INSTRUMENT; OPTICAL IMAGING; POLY (3-HEXYLTHIOPHENE); WIDE ANGLE X-RAY SCATTERING; WIGGLER BEAMLINE;

ELLIPSOMETRY; OPTICS; SCATTERING; X RAY SCATTERING;

X RAYS;

EID: 84866867320     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4738880     Document Type: Review

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