Band gap enhancement of glancing angle deposited TiO 2 nanowire array

Journal of Applied Physics

Volumn 112, Issue 5, 2012, Pages

  Chinnamuthu, P ^a   Mondal, A ^a   Singh, N K ^a   Dhar, J C ^a   Chattopadhyay, K K ^b   Bhattacharya, Sekhar ^c  

^a NATIONAL INSTITUTE OF TECHNOLOGY   (India)

^b JADAVPUR UNIVERSITY   (India)

^c SSN Research Centre   (India)

Author keywords

[No Author keywords available]

Indexed keywords

AZIMUTHAL ROTATION; BAND TRANSITIONS; BLUE SHIFT; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; GLANCING ANGLE; GLANCING ANGLE DEPOSITION TECHNIQUE; NANOWIRE ARRAYS; PHONON CONFINEMENT; PHOTOLUMINESCENCE EMISSION; PHOTON ABSORPTIONS; RAMAN FREQUENCIES; RAMAN SCATTERING INTENSITY; RUTILE AND ANATASE; TIO; UV-VIS ABSORPTIONS;

NANOWIRES; OXIDE MINERALS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

TITANIUM DIOXIDE;

EID: 84866389242     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4749801     Document Type: Conference Paper

References (32)

1. M. J. Riley, B. Williams, G. Y. Condon, J. Borja, T. M. Lu, W. N. Gill, and J. L. Plawsky, J. Appl. Phys. 111, 074904 (2012). 10.1063/1.3699370
2. X. Feng, K. Shankar, O. K. Varghese, M. Paulose, T. J. Latempa, and C. A. Grimes, Nano Lett. 8, 3781 (2008). 10.1021/nl802096a
3. W.-J. Yin, H. W. Tang, S.-H. Wei, J. Turner, M. M. Al-Jassim, and Y. Yan, Phys. Rev. B 82, 045106 (2010). 10.1103/PhysRevB.82.045106
4. X. Chen and S. S. Mao, Chem. Rev. 107, 2891 (2007). 10.1021/cr0500535
5. R. Asahi, T. Morikawa, T. Ohwaki, K. Aoki, and Y. Taga, Science 293, 269 (2001). 10.1126/science.1061051
6. K. Nishijima, B. Ohtani, X. L. Yan, T. Kamai, T. Chiyoya, T. Tsubota, N. Murakami, and T. Ohno, Chem. Phys. 339, 64 (2007). 10.1016/j.chemphys.2007.06. 014
7. S. Majumder, D. Paramanik, V. Solanki, B. P. Bag, and S. Varma, Appl. Phys. Lett. 98, 053105 (2011). 10.1063/1.3549768
8. S. In, A. Orlov, R. Berg, F. Carca, S. Pedrosa-Jimenez, M. S. Tikhov, D. S. Wright, and R. M. Lambert, J. Am. Chem. Soc. 129, 13790 (2007). 10.1021/ja0749237
9. G. Liu, F. Li, D.-W. Wang, D.-M. Tang, C. Liu, X. Ma, G. Q. Lu, and H.-M. Cheng, Nanotechnology 19, 025606 (2008). 10.1088/0957-4484/19/02/025606
10. A. Dieguez, A. Romano-Rodrguez, A. Vila', and J. R. Morante, J. Appl. Phys. 90, 1550 (2001). 10.1063/1.1385573
11. P. Chinnamuthu, J. C. Dhar, A. Mondal, A. Bhattacharyya, and N. K. Singh, J. Phys. D: Appl. Phys. 45, 135102 (2012). 10.1088/0022-3727/45/13/135102
12. K. Robbie, G. Beydaghyan, T. Brown, C. Dean, J. Adams, and C. Buzea, Rev. Sci. Instrum. 75, 1089 (2004). 10.1063/1.1667254
13. K. Robbie, J. C. Sit, and M. J. Brett, J. Vac. Sci. Technol. B 16, 1115 (1998). 10.1116/1.590019
14. K. Eufinger, D. Poelman, H. Poelman, R. De Gryse, and G. B. Marin, Appl. Surf. Sci. 254, 148 (2007). 10.1016/j.apsusc.2007.07.009
15. A. C. van Popta, J. Cheng, J. C. Sit, and M. J. Brett, J. Appl. Phys. 102, 013517 (2007). 10.1063/1.2752132
16. M. J. Colgan, B. Djurfors, D. G. Ivey, and M. J. Brett, Thin Solid Films 466, 92 (2004). 10.1016/j.tsf.2004.02.019
17. M. Suzuki, T. Ito, and Y. Taga, Appl. Phys. Lett. 78, 3968 (2001). 10.1063/1.1380730
18. Y. P. He, Z. Y. Zhang, and Y. P. Zhao, J. Vac. Sci. Technol. B 26, 1350 (2008). 10.1116/1.2949111
19. G. K. Dalapati, S. Chatterjee, S. K. Samanta, and C. K. Maiti, Appl. Surf. Sci. 210, 249 (2003). 10.1016/S0169-4332(03)00149-1
20. M. Lottiaux, C. Boulesteix, G. Nihoul, F. Varnier, F. Flory, R. Galindo, and E. Pelletier, Thin Solid Films 170, 107 (1989). 10.1016/0040-6090(89)90627-5
21. T. Ohsaka, F. Izumi, and Y. Fujiki, J. Raman Spectrosc. 7, 321 (1978). 10.1002/jrs.1250070606
22. L. Escobar-Alarcón, E. Haro-Poniatowski, M. A. Camacho-López, M. Fernández-Guasti, J. Jímenez- Jarquín, and A. Sánchez-Pineda, Appl. Surf. Sci. 137, 38 (1999). 10.1016/S0169-4332(98)00486-3
23. A. Li. Bassi, D. Cattaneo, V. Russo, C. E. Bottani, E. Barborini, E. Barborini, T. Mazza, P. Piseri, P. Milani, F. O. Ernst, K. Wegner, and S. E. Pratsinis, J. Appl. Phys. 98, 074305 (2005). 10.1063/1.2061894
24. M. Subramanian, S. Vijayalakshmi, S. Venkataraj, and R. Jayavel, Thin Solid Films 516, 3776 (2008). 10.1016/j.tsf.2007.06.125
25. A. Mondal and U. Das, J. Phys. D: Appl. Phys. 42, 234002 (2009). 10.1088/0022-3727/42/23/234002
26. V. Swamy, A. Kuznetsov, L. S. Dubrovinsky, R. A. Caruso, D. G. Shchukin, and B. C. Muddle, Phys. Rev. B 71, 184302 (2005). 10.1103/PhysRevB.71.184302
27. C. A. Melendres, A. Narayanasamy, V. A. Maroni, and R. W. Siegel, J. Mater. Res. 4, 1246 (1989). 10.1557/JMR.1989.1246
28. J. C. Parker and R. W. Siegel, J. Mater. Res. 5, 1246 (1990). 10.1557/JMR.1990.1246
29. J. C. Parker and R. W. Siegel, Appl. Phys. Lett. 57, 943 (1990). 10.1063/1.104274
30. L. M. Otto, S. L. Diedenhofen, B. C. Kaas, R. E. Algra, E. P. A. M. Bakkers, J. G. Rivas, and L. Ad, Nano Lett. 9, 930 (2009). 10.1021/nl802580r
31. H. Tang, F. Levy, H. Berger, and P. E. Schmid, Phys. Rev. B 52, 7771 (1995). 10.1103/PhysRevB.52.7771
32. R. Janisch, P. Gopal, and N. A. Spaldin, J. Phys.: Condens. Matter 17, R657 (2005). 10.1088/0953-8984/17/27/R01