Layer number and stacking sequence imaging of few-layer graphene by transmission electron microscopy

Nano Letters

Volumn 12, Issue 9, 2012, Pages 4635-4641

  Ping, Jinglei ^a   Fuhrer, Michael S ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

Graphene; layer number; stacking order; TEM

Indexed keywords

DARK FIELD IMAGES; DARK-FIELD TRANSMISSION ELECTRON MICROSCOPY; DIFFRACTION SPOTS; FEW-LAYER GRAPHENE; LAYER NUMBER; RELATIVE INTENSITY; SECOND ORDERS; SPATIAL RESOLUTION; STACKING ORDER; STACKING SEQUENCE;

CHEMICAL VAPOR DEPOSITION; MULTILAYERS; TRANSMISSION ELECTRON MICROSCOPY;

GRAPHENE;

GRAPHITE; NANOMATERIAL;

ARTICLE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; PARTICLE SIZE; SURFACE PROPERTY; TRANSMISSION ELECTRON MICROSCOPY; ULTRASTRUCTURE;

CRYSTALLIZATION; GRAPHITE; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MICROSCOPY, ELECTRON, TRANSMISSION; MOLECULAR CONFORMATION; NANOSTRUCTURES; PARTICLE SIZE; SURFACE PROPERTIES;

EID: 84866321600     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl301932v     Document Type: Article

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