Structural characterization of PVA capped ZnS nanostructured thin films

Indian Journal of Physics

Volumn 86, Issue 8, 2012, Pages 703-707

  Barman, B ^a   Sarma, K C ^a  

^a GAUHATI UNIVERSITY   (India)

Author keywords

Average internal stress; Lattice constant; Microstrain; X ray diffraction; ZnS nanocrystals

Indexed keywords

EID: 84866299852     PISSN: 09731458     EISSN: 09749845     Source Type: Journal    
DOI: 10.1007/s12648-012-0116-0     Document Type: Article

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