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Volumn 28, Issue 1, 2005, Pages 43-47

Preparation and study of thickness dependent electrical characteristics of zinc sulfide thin films

Author keywords

Electrical properties; Nanostructures; Zinc sulfide

Indexed keywords

ACTIVATION ENERGY; CARRIER MOBILITY; DEPOSITION; DISSOCIATION; ELECTRIC CONDUCTIVITY; NANOSTRUCTURED MATERIALS; OPTIMIZATION; PH EFFECTS; THICKNESS MEASUREMENT; ZINC SULFIDE;

EID: 13844255269     PISSN: 02504707     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02711171     Document Type: Review
Times cited : (71)

References (15)
  • 1
    • 13844302310 scopus 로고    scopus 로고
    • ASTM diffraction data file card. No. 12-688, 10-434, 5-0492
    • ASTM diffraction data file card. No. 12-688, 10-434, 5-0492


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.