Field ion microscope evaluation of tungsten nanotip shape using He and Ne imaging gases

Ultramicroscopy

Volumn 122, Issue , 2012, Pages 60-64

  Urban, Radovan ^a,b   Wolkow, Robert A ^a,b   Pitters, Jason L ^b  

^a UNIVERSITY OF ALBERTA   (Canada)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

Field ion microscopy; Gas field ion source; Nanotip

Indexed keywords

ETCHING PARAMETERS; ETCHING PROCESS; EVAPORATION PROCESS; FIELD ION MICROSCOPE; FIELD ION MICROSCOPY; GAS FIELDS; SELECTIVE ETCHING; TIP APEX; TIP SHAPE; TUNGSTEN ATOMS;

ATOMS; ETCHING; EVAPORATION; GAS INDUSTRY; HELIUM; ION MICROSCOPES; ION SOURCES; NANOTIPS; NITROGEN; PHASE TRANSITIONS; TUNGSTEN;

NEON;

HELIUM; LIQUID NITROGEN; NANOMATERIAL; NANOTIP; NEON; TUNGSTEN; UNCLASSIFIED DRUG; NITROGEN;

ARTICLE; CORROSION; CRYSTAL STRUCTURE; ELECTRIC POTENTIAL; EVAPORATION; FIELD ION MICOSCOPE; FIELD ION MICROSCOPY; IMAGE ANALYSIS; IONIZATION; MICROSCOPE; MICROSCOPY; SCANNING ION MICROSCOPY; SIGNAL NOISE RATIO; ATOM; CHEMICAL PROCEDURES; CHEMICAL REACTION; ETCHING; FIELD ION MICROSCOPE;

EID: 84866274529     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.07.026     Document Type: Article

References (16)

1. Fink H.W. IBM Journal of Research and Development 1986, 30:460-465.
2. Fu T.Y., Cheng L.C., Nien C.H., Tsong T.T. Physical Review B 2001, 64:113401.
3. Rezeq M., Pitters J., Wolkow R. Journal of Chemical Physics 2006, 124:204716.
4. Ward B.W., Notte John A., Economou N.P. Journal of Vacuum Science and Technology B 2006, 24:2871-2874.
5. Rahman F., Onoda J., Imaizumi K., Mizuno S. Surface Science 2008, 602:2128-2134.
6. Tondare V.N. Journal Of Vacuum Science and Technology B 2005, 23:1498-1508.
7. Muller E.W. Journal of Applied Physics 1956, 27:474.
8. Nishikawa O., Muller E.W. Journal of Applied Physics 1964, 35:2806.
9. E.W. Muller, T.T. Tsong, Field Ion Microscopy, (1969) 186-189.
10. J.L. Pitters, R. Urban, S. Matsubara, R.A. Wolkow, Tip apex shaping of gas field ion sources, Ultramicroscopy, submitted for publication.
11. Muller E.W. Advances in Electronics and Electron Physics 1960, 13:88.
12. Mulson J., Muller E.W. Journal of Chemical Physics 1963, 38:2615.
13. Cranstoun G., Anderson J. Surface Science 1973, 35:319.
14. Urban R., Pitters J.L., Wolkow R.A. Applied Physics Letters 2012, 100:263105.
15. Langmuir D. Proceedings of the Institute of Radio Engineers 1937, 25:977.
16. Pitters J.L., Urban R., Wolkow R.A. Journal of Chemical Physics 2012, 136:154704.