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Volumn 37, Issue 18, 2012, Pages 3765-3767

How to optically count graphene layers

(7) Cheon, Sosan a Kihm, Kenneth David a,b Park, Jae Sung a Lee, Joon Sik a Lee, Byeong Jun c Kim, Hyeoungkeun d Hong, Byung Hee a

a Seoul National University (South Korea)

b University of Tennessee (United States)

c Yeungnam University (South Korea)

d Korea Electronic Technology Institute (KETI) (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; REFLECTION; SURFACE PLASMON RESONANCE;

ANGLE SHIFTS; GRAPHENE LAYERS; MULTILAYER GRAPHENE; NON-INTRUSIVE; REAL TIME; REFLECTANCE CURVE; SINGLE LAYER; THIN GOLD FILM;

GRAPHENE;

EID: 84866269092 PISSN: 01469592 EISSN: 15394794 Source Type: Journal
DOI: 10.1364/OL.37.003765 Document Type: Article

Times cited : (25)

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