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Volumn 545, Issue , 2012, Pages 90-98
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Surface morphology and depth profile study of Cd 1-xZn xTe alloy nanostructures
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Author keywords
AFM; CdZnTe; EDS; SEM; Sputtering; XPS; XRD
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Indexed keywords
AFM;
ANNEALING PROCESS;
ANNEALING TEMPERATURES;
CDZNTE;
CHEMICAL COMPOSITIONS;
DEPOSITED FILMS;
DEPOSITION PROCESS;
DEPTH PROFILE;
DIAGNOSTIC TECHNIQUES;
GLASS SUBSTRATES;
IN-SITU HEATING;
POLYCRYSTALLINE STRUCTURE;
POST DEPOSITION ANNEALING;
SPUTTERING TARGET;
TRANSMISSION SPECTRUMS;
UV TRANSMISSION;
XPS MEASUREMENTS;
XRD;
XRD MEASUREMENTS;
XRD STUDIES;
AMORPHOUS FILMS;
AMORPHOUS MATERIALS;
ANNEALING;
ATMOSPHERIC PRESSURE;
ATOMIC FORCE MICROSCOPY;
CADMIUM COMPOUNDS;
CERIUM ALLOYS;
DEPOSITS;
ENERGY DISPERSIVE SPECTROSCOPY;
NANOSTRUCTURES;
PHOTOELECTRONS;
SCANNING ELECTRON MICROSCOPY;
SPUTTERING;
SUBSTRATES;
THIN FILMS;
VAPOR DEPOSITION;
X RAY DIFFRACTION;
X RAY PHOTOELECTRON SPECTROSCOPY;
ZINC;
CADMIUM ALLOYS;
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EID: 84866054042
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2012.08.028 Document Type: Article |
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Times cited : (27)
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References (29)
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