Characterization of zirconium carbides using electron microscopy, optical anisotropy, Auger depth profiles, X-ray diffraction, and electron density calculated by charge flipping method

Journal of Solid State Chemistry

Volumn 194, Issue , 2012, Pages 91-99

  Chinthaka Silva, G W ^a   Kercher, Andrew A ^a   Hunn, John D ^a   Martin, Rodger C ^a   Jellison, Gerald E ^a   Meyer, Harry M ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Auger depth profile; Charge flipping; Optical anisotropy; SEM; Zirconium carbide

Indexed keywords

ANISOTROPY MEASUREMENTS; CARBON INCORPORATION; CARBON RATIO; CARBON VACANCY; CHARGE FLIPPING; DEPTH PROFILE; END-PRODUCTS; EXPERIMENTAL TECHNIQUES; GRAIN SIZE; GRAPHITIC CARBONS; MOLAR RATIO; NON-LINEARITY; POLYCRYSTALLINE; UNIT CELLS; ZIRCONIUM CARBIDE;

AUGERS; CARBIDES; CARBON; CARRIER CONCENTRATION; ELECTRON DENSITY MEASUREMENT; ELECTRON MICROSCOPY; ELECTRONS; LATTICE CONSTANTS; OPTICAL ANISOTROPY; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION; ZIRCONIUM;

ZIRCONIUM COMPOUNDS;

EID: 84866051895     PISSN: 00224596     EISSN: 1095726X     Source Type: Journal    
DOI: 10.1016/j.jssc.2012.04.047     Document Type: Article

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