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Volumn 101, Issue 9, 2012, Pages

Low-frequency critical current noise in Josephson junctions induced by temperature fluctuations

(11) Anton, S M a Nugroho, C D b Birenbaum, J S a O'Kelley, S R a Orlyanchik, V b Dove, A F b Olson, G A b Yoscovits, Z R b Eckstein, J N b Van Harlingen, D J b Clarke, John a

a UNIVERSITY OF CALIFORNIA (United States)

b United States of America (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT FLUCTUATIONS; CRITICAL CURRENT NOISE; CROSS-CORRELATIONS; CRYOGENIC SYSTEM; FABRICATION TECHNIQUE; JOSEPHSON; JOSEPHSON JUNCTIONS; LOW FREQUENCY; NOISE SOURCE; TEMPERATURE DEPENDENCE; TEMPERATURE FLUCTUATION; TEMPERATURE INSTABILITY; TEMPERATURE STABILITY;

ALUMINUM; JOSEPHSON JUNCTION DEVICES; TEMPERATURE DISTRIBUTION;

CRITICAL CURRENTS;

EID: 84865839969 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4749282 Document Type: Article

Times cited : (11)

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