Characterization of thin film PV modules under standard test conditions: Results of indoor and outdoor measurements and the effects of sunlight exposure

Solar Energy

Volumn 86, Issue 10, 2012, Pages 3049-3056

  Munoz Garcia M A ^a   Marin, O ^a   Alonso Garcia M C ^b   Chenlo, F ^b  

^a Electrotechnical Section   (Spain)

^b CIEMAT   (Spain)

Author keywords

CdTe; CIS; Light activation; PV module characterisation; Thin film

Indexed keywords

CDTE; CIS; INDOOR MEASUREMENT; LIGHT ACTIVATION; PHOTOVOLTAIC MARKETS; PHOTOVOLTAIC MODULES; POWER RATES; PV MODULES; STANDARD TEST CONDITION (STC); SUNLIGHT EXPOSURE; TESTING METHOD; THIN-FILM TECHNOLOGY;

CADMIUM TELLURIDE; TECHNOLOGY;

THIN FILMS;

CADMIUM; FILM; PHOTOVOLTAIC SYSTEM; POWER GENERATION; PRODUCT DEVELOPMENT; QUALITY CONTROL; SILICON; SOLAR RADIATION; TECHNOLOGICAL DEVELOPMENT; TELLURIUM; TESTING METHOD;

EID: 84865733238     PISSN: 0038092X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solener.2012.07.015     Document Type: Article

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