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Volumn 85, Issue 9, 2011, Pages 2264-2274

Early degradation of silicon PV modules and guaranty conditions

Author keywords

Defects; Degradation; Module testing; PV module

Indexed keywords

DEFECT-FREE; FIELD MEASUREMENT; I - V CURVE; INSTALLED CAPACITY; IV CHARACTERISTICS; MANUFACTURING DEFECTS; MODULE TESTING; NORMAL OPERATIONS; OPERATIONAL CONDITIONS; OVER-VOLTAGES; POWER INVERTERS; PV MODULES; PV PLANTS; RELIABILITY TEST; STANDARD TESTS; THERMAL BEHAVIOURS; THERMAL EVALUATIONS; VISUAL INSPECTION; WHOLE PLANTS;

EID: 80051598371     PISSN: 0038092X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solener.2011.06.011     Document Type: Article
Times cited : (310)

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