Characterization of degradation in thin-film photovoltaic module performance parameters

Renewable Energy

Volumn 28, Issue 9, 2003, Pages 1455-1469

  Meyer, E L ^a   van Dyk, E E ^a  

^a NELSON MANDELA METROPOLITAN UNIVERSITY   (South Africa)

Author keywords

Assessing reliability; Characterization; Degradation analysis; Module performance; Thin film modules

Indexed keywords

PHOTOVOLTAIC CELLS; SILANES; STABILITY;

STAEBLER-WRONSKI EFFECT;

THIN FILMS;

PHOTOVOLTAIC SYSTEM;

EID: 0037410842     PISSN: 09601481     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0960-1481(02)00062-9     Document Type: Article

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