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Journal of Non-Crystalline Solids

Volumn 358, Issue 17, 2012, Pages 2474-2477

Variation of back reflector morphology in n-i-p microcrystalline silicon thin film solar cells using texture-etched ZnO

(4) Bottler W a Smirnov, V a Hupkes J a Finger, F a

a FORSCHUNGSZENTRUM JÜLICH (Germany)

Author keywords

Light trapping; Si thin film solar cells; Surface morphology; ZnO

Indexed keywords

BACK REFLECTORS; CRATER SIZES; ETCHING TIME; LATERAL SIZES; LIGHT-TRAPPING; MICROCRYSTALLINE SILICON THIN FILMS; ROOT MEAN SQUARE ROUGHNESS; SOLAR CELL PERFORMANCE; SURFACE FEATURE; THIN FILM SOLAR CELLS; ZNO; ZNO LAYERS;

MORPHOLOGY; REFLECTION; SILICON; SURFACE MORPHOLOGY; TEXTURES; ZINC OXIDE;

SOLAR CELLS;

EID: 84865714967 PISSN: 00223093 EISSN: None Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2011.12.100 Document Type: Conference Paper

Times cited : (8)

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