On delamination growth from channel cracks in thin-film coatings

International Journal of Solids and Structures

Volumn 49, Issue 22, 2012, Pages 3142-3147

  Chai, Herzl ^a   Fox, Joseph ^a  

^a TEL AVIV UNIVERSITY   (Israel)

Author keywords

Channel cracks; Delamination; Fracture energy; Interface; Thin film

Indexed keywords

BONDING SURFACES; CHANNEL CRACKING; DELAMINATION GROWTH; GENERAL TRENDS; GLASS PLATE; GLASS SURFACES; IN-SITU; INTERFACIAL FRACTURE; LAYERED STRUCTURES; MATERIAL VARIABILITY; OPTIMAL DESIGN; PREMATURE FAILURES; SINGLE CHANNELS; SYSTEM VARIABLES; THIN-FILM COATINGS;

CRACKS; EPOXY RESINS; FILM GROWTH; FRACTURE; FRACTURE ENERGY; FRACTURE TOUGHNESS; GLASS; INTERFACES (MATERIALS); ULTRATHIN FILMS;

DELAMINATION;

EID: 84865514260     PISSN: 00207683     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijsolstr.2012.06.012     Document Type: Article

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