Raman microprobe analysis of elastic strain and fracture in electrophoretically deposited CdSe nanocrystal films

Nano Letters

Volumn 6, Issue 2, 2006, Pages 175-180

  Banerjee, Sarbajit ^a   Jia, Shengguo ^a   Kim, Dae I ^a   Robinson, Richard D ^a   Kysar, Jeffrey W ^a   Bevk, Joze ^a   Herman, Irving P ^a  

^a Och Spine at New York Presbyterian Hospitals   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRACK DIMENSIONS; ELASTIC STRAIN; NANOCRYSTAL FILMS; RAMAN MICROPROBE ANALYSIS;

CRACK INITIATION; ELASTIC MODULI; FRACTURE; MECHANICAL PROPERTIES; STRAIN MEASUREMENT; TENSILE STRENGTH;

THIN FILMS;

CADMIUM DERIVATIVE; CADMIUM SELENIDE; NANOMATERIAL; SELENIUM DERIVATIVE;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; ELECTROPHORESIS; METHODOLOGY; PARTICLE SIZE; RAMAN SPECTROMETRY; SENSITIVITY AND SPECIFICITY; SURFACE PROPERTY;

CADMIUM COMPOUNDS; ELECTROPHORESIS; MEMBRANES, ARTIFICIAL; NANOSTRUCTURES; PARTICLE SIZE; SELENIUM COMPOUNDS; SENSITIVITY AND SPECIFICITY; SPECTRUM ANALYSIS, RAMAN; SURFACE PROPERTIES;

EID: 33644920746     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl051921g     Document Type: Article

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