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Volumn 119, Issue , 2012, Pages 102-105
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Photoelectron spectromicroscopy at chalcopyrite films
a
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Author keywords
Chalcopyrite; Photoelectron microscopy; Solar cells
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Indexed keywords
BAND OFFSETS;
BEAM LINES;
CHALCOPYRITE;
GAAS;
HOMOGENITY;
IN-SITU;
INTERFACE PARAMETERS;
PHOTOELECTRON MICROSCOPY;
PHOTOELECTRON SPECTROMICROSCOPY;
X-RAY PHOTOELECTRON EMISSION MICROSCOPIES;
ZNO;
LOW ENERGY ELECTRON DIFFRACTION;
PHOTOELECTRON SPECTROSCOPY;
PHOTOELECTRONS;
SOLAR CELLS;
X RAY PHOTOELECTRON SPECTROSCOPY;
ZINC OXIDE;
COPPER COMPOUNDS;
CHALCOPYRITE;
CHEMICAL COMPOUND;
SELENIDE;
UNCLASSIFIED DRUG;
ZINC;
ZINC OXIDE;
ACCURACY;
ARTICLE;
BINDING KINETICS;
ELECTRICAL EQUIPMENT;
ELECTRON DIFFRACTION;
FILM;
IMAGE QUALITY;
LIGHT INTENSITY;
MICROSCOPY;
PREDICTION;
SENSITIVITY AND SPECIFICITY;
SURFACE PROPERTY;
TRANSITION TEMPERATURE;
X RAY PHOTOELECTRON EMISSION MICROSCOPY;
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EID: 84865400152
PISSN: 03043991
EISSN: 18792723
Source Type: Journal
DOI: 10.1016/j.ultramic.2011.11.006 Document Type: Article |
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Times cited : (5)
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References (9)
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