-
1
-
-
0001386879
-
A 27.3% efficient ga0.5 in0.5 p/gaas tandem solar cell
-
J. M. Olson, S. R. Kurtz, A. E. Kibbler, and P. Faine, "A 27.3% efficient Ga0.5 In0.5 P/GaAs tandem solar cell," Appl. Phys. Lett., vol. 56, no. 7, pp. 623-625, 1990.
-
(1990)
Appl. Phys. Lett.
, vol.56
, Issue.7
, pp. 623-625
-
-
Olson, J.M.1
Kurtz, S.R.2
Kibbler, A.E.3
Faine, P.4
-
2
-
-
77953805382
-
Bandgap engineering architectures for high efficiency multijunction concentrator cells
-
R. R. King, A. Boca, W. Hong, X.-Q. Liu, D. Bhusari, D. Larrabee, K. M. Edmondson, D. C. Law, C. M. Fetzer, S.Mesropian, and N. H. Karam, "Bandgap engineering architectures for high efficiency multijunction concentrator cells," in Proc. 24th Eur. Photovolt. Sol. Energy Conf., 2009, pp. 55-61.
-
(2009)
Proc. 24th Eur. Photovolt. Sol. Energy Conf.
, pp. 55-61
-
-
King, R.R.1
Boca, A.2
Hong, W.3
Liu, X.-Q.4
Bhusari, D.5
Larrabee, D.6
Edmondson, K.M.7
Law, D.C.8
Fetzer, C.M.9
Mesropian, S.10
Karam, N.H.11
-
3
-
-
78650125770
-
Ingap/gaas/ingaas 41% concentrator cells using bi-facial epigrowth
-
S.Wojtczuk, P. Chiu,X. Zhang, D. Derkacs,C.Harris, D. Pulver,C.Harris, and M. Timmons, "InGaP/GaAs/InGaAs 41% concentrator cells using Bi-facial epigrowth," in Proc. 35th IEEE Photovolt. Spec. Conf., 2010, pp. 1259-1264.
-
(2010)
Proc. 35th IEEE Photovolt. Spec. Conf.
, pp. 1259-1264
-
-
S.Wojtczuki Chiu, P.1
Zhang, X.2
Derkacs, D.3
C.Harris Pulver, D.4
Harris, C.5
Timmons, M.6
-
4
-
-
84055222185
-
42% 500X Bi-facial growth concentrator cells
-
Apr.
-
S. Wojtczuk, P. Chiu, X. Zhang, D. Pulver, C. Harris, and B. Siskavich, "42% 500X Bi-facial growth concentrator cells," in Proc. AIP Conf., Apr. 2011, vol. 1407, pp. 9-12.
-
(2011)
Proc. AIP Conf.
, vol.1407
, pp. 9-12
-
-
Wojtczuk, S.1
Chiu, P.2
Zhang, X.3
Pulver, D.4
Harris, C.5
Siskavich, B.6
-
5
-
-
84861043613
-
42.3% Efficient InGaP/GaAs/InGaAs concentrators using bifacial epigrowth
-
to be published
-
P. Chiu, S. Wojtczuk, X. Zhang, C. Harris, D. Pulver, and M. Timmons, "42.3% Efficient InGaP/GaAs/InGaAs concentrators using bifacial epigrowth," in Proc. 37th IEEE Photovolt. Spec. Conf., 2011, to be published.
-
(2011)
Proc. 37th IEEE Photovolt. Spec. Conf.
-
-
Chiu, P.1
Wojtczuk, S.2
Zhang, X.3
Harris, C.4
Pulver, D.5
Timmons, M.6
-
6
-
-
84861058091
-
Temperature dependence of ingap/gaas/ingaas concentrators using bifacial epigrowth
-
to be published
-
P. Chiu, S. Wojtczuk, X. Zhang, C. Harris, and D. Pulver, "Temperature dependence of InGaP/GaAs/InGaAs concentrators using bifacial epigrowth," in Proc. 37th IEEE Photovolt. Spec. Conf., 2011, to be published.
-
(2011)
Proc. 37th IEEE Photovolt. Spec. Conf.
-
-
Chiu, P.1
Wojtczuk, S.2
Zhang, X.3
Harris, C.4
Pulver, D.5
-
7
-
-
78650685081
-
Solar cell efficiency tables (version 37)
-
M.A.Green,K. Emery,Y.Hishikawa, andW.Warta, "Solar cell efficiency tables (version 37)," Prog. Photovolt. Res. Appl., vol. 19, pp. 84-92, 2011.
-
(2011)
Prog. Photovolt. Res. Appl.
, vol.19
, pp. 84-92
-
-
Green, M.A.1
Emery, K.2
Hishikawa, Y.3
Warta, W.4
-
8
-
-
52949112244
-
40.8% efficient inverted triple junction solar cell with two independently metamorphic junctions
-
J. F. Geisz, D. J. Friedman, J. S. Ward, A. Duda, W. J. Olavarria, T. E. Moriarity, J. T. Kiehl, M. J. Romero, A. G. Norman, and K. M. Jones, "40.8% efficient inverted triple junction solar cell with two independently metamorphic junctions," Appl. Phys. Lett., vol. 93, 123505, 2008.
-
(2008)
Appl. Phys. Lett.
, vol.93
, pp. 123505
-
-
Geisz, J.F.1
Friedman, D.J.2
Ward, J.S.3
Duda, A.4
Olavarria, W.J.5
Moriarity, T.E.6
Kiehl, J.T.7
Romero, M.J.8
Norman, A.G.9
Jones, K.M.10
-
9
-
-
80053551009
-
43.5% efficient lattice matched solar cells
-
M.Wiemer, V. Sabnis, and H. Yuen, "43.5% efficient lattice matched solar cells," in Proc. SPIE, 2011, vol. 8108, 810804.
-
(2011)
Proc. SPIE
, vol.8108
, pp. 810804
-
-
M.Wiemer Sabnis, V.1
Yuen, H.2
-
10
-
-
36149007117
-
Infrared absorption and electron effective mass in n-Type gallium arsenide
-
W. G. Spitzer and J.M.Whelan, "Infrared absorption and electron effective mass in n-Type gallium arsenide," Phys. Rev., vol. 114, no. 1, pp. 59-63, 1959.
-
(1959)
Phys. Rev.
, vol.114
, Issue.1
, pp. 59-63
-
-
Spitzer, W.G.1
Whelan, J.M.2
-
11
-
-
0027915647
-
Competing kinetic and thermodynamic processes in the growth and ordering of ga0.5 in0.5 p
-
doi: 10.1557/PROC-312-83
-
S. R. Kurtz, J. M. Olson, D. J. Arent, A. E. Kibbler, and K. A. Bertness, "Competing kinetic and thermodynamic processes in the growth and ordering of Ga0.5 In0.5 P," MRS Proc., 312, 83, 1993, doi: 10.1557/PROC-312-83.
-
(1993)
MRS Proc.
, vol.312
, pp. 83
-
-
Kurtz, S.R.1
Olson, J.M.2
Arent, D.J.3
Kibbler, A.E.4
Bertness, K.A.5
-
12
-
-
0346104882
-
Spectral Response Measurements of Monolithic GaInP/Ga(In)As/Ge Triple-Junction Solar Cells: Measurement Artifacts and their Explanation
-
DOI 10.1002/pip.514
-
M. Meusel, C. Baur, G. Letay, A. W. Bett, W. Warta, and E. Fernandez, "Spectral response measurements of monolithic GaInP/Ga(In)As/Ge triple-junction solar cells: Measurement artifacts and their explanation," Prog. Photovolt.: Res. Appl., vol. 11, pp. 499-514, 2003. (Pubitemid 37539781)
-
(2003)
Progress in Photovoltaics: Research and Applications
, vol.11
, Issue.8
, pp. 499-514
-
-
Meusel, M.1
Baur, C.2
Letay, G.3
Bett, A.W.4
Warta, W.5
Fernandez, E.6
-
15
-
-
0000506216
-
Band-edge discontinuities of strained-layer inx ga1-x as/gaas heterojunctions and quantum wells
-
S. Niki, C. L. Lin,W. S. C. Chang, andH.H.Wieder, "Band-edge discontinuities of strained-layer InX Ga1-X As/GaAs heterojunctions and quantum wells," Appl. Phys. Lett., vol. 55, no. 13, pp. 1339-1341, 1989.
-
(1989)
Appl. Phys. Lett.
, vol.55
, Issue.13
, pp. 1339-1341
-
-
Niki, S.1
Lin, C.L.2
Chang, W.S.C.3
Wieder, H.H.4
-
16
-
-
21544456980
-
Use of misfit strain to remove dislocations from epitaxial thin films
-
J. W. Matthews, A. E. Blakeslee, and S. Mader, "Use of misfit strain to remove dislocations from epitaxial thin films," Thin Solid Films, vol. 33, pp. 253-266, 1976.
-
(1976)
Thin Solid Films
, vol.33
, pp. 253-266
-
-
Matthews, J.W.1
Blakeslee, A.E.2
Mader, S.3
-
17
-
-
0000171297
-
Role of experimental resolution in measurements of critical layer thickness for strained-layer epitaxy
-
I. J. Fritz, "Role of experimental resolution in measurements of critical layer thickness for strained-layer epitaxy," Appl. Phys. Lett., vol. 51, no. 14, pp. 1080-1082, 1987.
-
(1987)
Appl. Phys. Lett.
, vol.51
, Issue.14
, pp. 1080-1082
-
-
Fritz, I.J.1
|