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Applied Physics Letters

Volumn 101, Issue 6, 2012, Pages

A Josephson junction defect spectrometer for measuring two-level systems

(4) Stoutimore, M J A a,b Khalil, M S a,b Lobb, C J b,c Osborn, K D a

a LABORATORY FOR PHYSICAL SCIENCES (United States)

b UNIVERSITY OF MARYLAND (United States)

c UNIVERSITY OF MARYLAND (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HARMONIC OSCILLATORS; JOSEPHSON JUNCTIONS; JUNCTION BARRIER; LOSS TANGENT; RESONANCE FREQUENCIES; SINGLE PHOTON EXCITATION; SPLITTINGS; TWO-LEVEL SYSTEM;

DEFECTS; MAGNETIC FLUX; QUANTUM OPTICS; SPECTROMETERS; SPECTROMETRY;

JOSEPHSON JUNCTION DEVICES;

EID: 84865145280 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4744901 Document Type: Article

Times cited : (36)

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