Loss dependence on geometry and applied power in superconducting coplanar resonators

IEEE Transactions on Applied Superconductivity

Volumn 21, Issue 3 PART 1, 2011, Pages 879-882

  Khalil, Moe S ^a   Wellstood, F C ^b   Osborn, Kevin D ^b  

^a LABORATORY FOR PHYSICAL SCIENCES   (United States)

^b University of Maryland   (United States)

Author keywords

Dielectric loss; Superconducting microwave resonators; Superconducting quantum computing; Two level systems

Indexed keywords

ALUMINUM FILM; COHERENCE TIME; COPLANAR RESONATORS; COPLANAR STRIPS; FUNCTION OF FREQUENCY; HIGH QUALITY FACTORS; HYBRID DESIGN; INTERNAL QUALITY FACTORS; LOW TEMPERATURES; MICROWAVE RESONATORS; OXIDE LAYER; PHOTON NUMBERS; RESONANT FREQUENCIES; RESONATOR GEOMETRY; SAPPHIRE SUBSTRATES; SINGLE LAYER; SUPERCONDUCTING MICROWAVE RESONATORS; SUPERCONDUCTING QUANTUM COMPUTING; SUPERCONDUCTING QUBITS; TRANSMITTED POWER; TWO-LEVEL SYSTEM;

DIELECTRIC LOSSES; MICROWAVE DEVICES; NATURAL FREQUENCIES; PHOTONS; QUANTUM COMPUTERS; QUANTUM OPTICS; RESONATORS;

SUPERCONDUCTIVITY;

EID: 79957929103     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2010.2090330     Document Type: Conference Paper

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