Thermoelectric properties of silicon nanowire array and spin-on glass composites fabricated with CMOS-compatible techniques

Materials Research Society Symposium Proceedings

Volumn 1408, Issue , 2012, Pages 61-66

  Curtin, Benjamin M ^a   Bowers, John E ^a  

^a University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS COMPATIBLE; ELECTRICAL CONDUCTIVITY; INTERFERENCE LITHOGRAPHY; PACKING DENSITY; SEEBECK COEFFICIENT MEASUREMENT; SI SUBSTRATES; SILICON NANOWIRE ARRAYS; SILICON NANOWIRES; SPIN-ON GLASS; SQUARE LATTICES; TEMPERATURE DIFFERENCES; THERMOELECTRIC MATERIAL; THERMOELECTRIC PROPERTIES;

ELECTRIC CONDUCTIVITY; GLASS; NANOTUBES; NANOWIRES; PHOTORESISTS; SEEBECK COEFFICIENT; SPIN GLASS; SUBSTRATES; THERMAL CONDUCTIVITY OF SOLIDS; THERMOELECTRIC EQUIPMENT; THERMOELECTRICITY;

SILICON;

EID: 84864991407     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/opl.2012.194     Document Type: Conference Paper

References (12)

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