Measuring the effects of low energy ion milling on the magnetization of Co/Pd multilayers using scanning electron microscopy with polarization analysis

Journal of Applied Physics

Volumn 107, Issue 9, 2010, Pages

  McMorran, B J ^a   Cochran, A C ^a   Dumas, R K ^b   Liu, Kai ^b   Morrow, P ^c   Pierce, D T ^a   Unguris, J ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LOW ENERGY ION MILLING; MAGNETIZATION ANGLE; MAGNETIZATION PROFILE; QUANTITATIVE IMAGING; SCANNING ELECTRON MICROSCOPY WITH POLARIZATION ANALYSIS; SPATIAL RESOLUTION; SURFACE MAGNETIZATIONS; VECTOR COMPONENTS;

ARGON; IONS; MAGNETIZATION; MULTILAYER FILMS; MULTILAYERS; POLARIZATION; SCANNING ELECTRON MICROSCOPY;

MILLING (MACHINING);

EID: 79951844553     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3358218     Document Type: Article

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