In situ and tomographic observations of defect free channel formation in ion irradiated stainless steels

Micron

Volumn 43, Issue 11, 2012, Pages 1099-1107

  Kacher, J ^a   Liu, G S ^a   Robertson, I M ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

Dislocations; Electron tomography; Ion irradiation; Stainless steel; Transmission electron microscopy

Indexed keywords

CROSS-SLIP; DEFECT-FREE; DEFORMATION PROCESS; DISLOCATION MOTION; DISLOCATION NETWORKS; DISLOCATION PILEUP; ELECTRON TOMOGRAPHY; GRAIN INTERIORS; IN-SITU; IRRADIATION DEFECT; IRRADIATION-INDUCED DEFECTS; POST MORTEM; RESIDUAL DISLOCATIONS; SLIP PLANE; TOMOGRAPHIC; TRANSMISSION ELECTRON MICROSCOPE; UNIRRADIATED MATERIALS;

DEFORMATION; DISLOCATIONS (CRYSTALS); ELECTRIC IMPEDANCE TOMOGRAPHY; GRAIN BOUNDARIES; ION BOMBARDMENT; IRRADIATION; STAINLESS STEEL; TRANSMISSION ELECTRON MICROSCOPY;

DEFECTS;

EID: 84864815560     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2012.01.017     Document Type: Article

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