Studies on phase transformation and molecular orientation in nanostructured zinc phthalocyanine thin films annealed at different temperatures

Thin Solid Films

Volumn 520, Issue 21, 2012, Pages 6695-6704

  Chowdhury, Avijit ^a   Biswas, Bipul ^a   Majumder, Manisree ^a   Sanyal, Manik Kumar ^a   Mallik, Biswanath ^a  

^a DEPARTMENT OF MATERIALS SCIENCE   (India)

Author keywords

Annealing; Davydov splitting; Grain orientation; Nanoparticles; Nanorods; Optical spectroscopy; Thin films; Zinc phthalocyanine

Indexed keywords

AFM IMAGE; ANNEALING TEMPERATURES; DAVYDOV SPLITTING; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; FILM MORPHOLOGY; GRAIN ORIENTATION; GROWTH MECHANISMS; HIGH TEMPERATURE; IN-BAND; NANO-STRUCTURED; OPTICAL PROPERTIES OF THIN FILMS; OPTICAL SPECTROSCOPY; OPTOELECTRONIC PROPERTIES; ORGANOMETALLIC COMPOUNDS; POST DEPOSITION ANNEALING; QUARTZ GLASS; ROD-SHAPED; ROOM TEMPERATURE; ROOT MEAN SQUARE ROUGHNESS; SI (100) SUBSTRATE; TEM IMAGES; TRANSMISSION ELECTRON MICROSCOPY TEM; UV-VIS ABSORPTION SPECTRA; UV-VIS OPTICAL ABSORPTION; XRD; ZINC PHTHALOCYANINES;

ANNEALING; ATOMIC FORCE MICROSCOPY; DEPOSITION; ETHANOL; FIELD EMISSION MICROSCOPES; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GRAIN GROWTH; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MOLECULAR ORIENTATION; NANOPARTICLES; NANORODS; NITROGEN COMPOUNDS; OPTICAL PROPERTIES; ORGANOMETALLICS; PHASE TRANSITIONS; QUARTZ; THIN FILMS; ULTRAVIOLET SPECTROSCOPY; X RAY DIFFRACTION; ZINC COMPOUNDS;

VAPOR DEPOSITION;

EID: 84864776840     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2012.07.013     Document Type: Article

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