UV detectors based on ZnxIn2S3+x and related compounds

Proceedings of the International Semiconductor Conference, CAS

Volumn 1, Issue , 2003, Pages 147-150

  Arama, E ^a   Ababii, I ^a   Zhitar, V ^b   Shemyakova, T ^b  

^a STATE UNIVERSITY OF MEDICINE AND PHARMACY NICOLAE TESTEMITANU   (Moldova)

^b INSTITUTE OF APPLIED PHYSICS   (Moldova)

Author keywords

Degradation; Detectors; Filters; Optical surface waves; Photoconductivity; Photodetectors; Platinum; Schottky diodes; Semiconductor diodes; Zinc

Indexed keywords

DEGRADATION; DETECTORS; FILTERS (FOR FLUIDS); PHOTOCONDUCTIVITY; PHOTODETECTORS; PLATINUM; SCHOTTKY BARRIER DIODES; SURFACE WAVES; ZINC;

OPTICAL SURFACE WAVES; RELATED COMPOUNDS; SCHOTTKY DIODES; SURFACE-BARRIER STRUCTURES;

SEMICONDUCTOR DIODES;

EID: 84864587135     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SMICND.2003.1251365     Document Type: Conference Paper

References (12)

1. A. Malic, Y. Vygranenco, B. Shabashkevich et al., Proceedings-International Semiconductor Conference, Sinaia, Romania, 1, p. 185-188, 2001.
2. V.N. Komashchenko, K.V. Kolezhuk, E.A. Venger et al., Pis'ma v ZhTF, 28 (19), pp. 32-36, 2002.
3. E. Arama, Archives of the Balkan Medical Union, p. 164, 2002.
4. I. Ababii, E. Arama, V. Zhitar, Analele Ştiinţifice ale USM. Ser. Fiz-Mat, pp.45-49, 2002.
5. S. Radautsan, V. Raylyan, I. Tsiulyanu, et.al. Progr. Cryst. Growth and Charact. Caracas, pp. 397-399, 1985.
6. E. Arama, N. Grushko, V. Zhitar, S. Radautsan, Reports of the Academyf Sciences of the USSR, 227 (6), pp. 1329-1383, 1976.
7. E. Arama, N. Grushko, V. Zhitar, S. Radautsan, Journal of Technical Physics Letters, 2 (6), pp. 254-258, 1997.
8. N. Moldovyan, Bulletin of AS of the USSR. Ser. Inorganic Materials, 27 (9), pp. 1969-1971, 1993.
9. V.F. Zhitar, N.A. Moldovyan, E.D. Arama et al., Proceedings-XV Annual Semiconductor Conference, Sinaia, Romania, ICCE, pp. 267-270, 1992.
10. E. Arama, Intellectus. Chisinau, 4, pp. 72-75, 1999.
11. N. Moldovyan, D. Remenko, USSR Author Certificate N1050302.
12. G. Brezeanu, M. Badila, P. Godignon et. al., Proceedings-Inernationa. Semiconuctor Conference, Sinaia, Romania, pp. 345-348, 2001.