Spectroscopic defect imaging in magnetic nanostructure arrays

Applied Physics Letters

Volumn 101, Issue 4, 2012, Pages

  Chia, Han Jong ^a,b   Guo, Feng ^a,b   Belova, L M ^c   McMichael, R D ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

^c ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT IMAGING; DEFECTIVE DEVICES; DEFECTIVE STRUCTURES; FERROMAGNETIC RESONANCE FORCE MICROSCOPY; MAGNETIC NANODEVICES; MAGNETIC NANOSTRUCTURES; OVAL DEFECTS; RESONANCE CONDITION; RESONANT FIELDS; TWO-DIMENSIONAL SCAN;

DEFECTS; IMAGING TECHNIQUES;

NANOSTRUCTURED MATERIALS;

EID: 84864492848     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4738789     Document Type: Review

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