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Journal of Raman Spectroscopy

Volumn 43, Issue 7, 2012, Pages 945-948

Nondestructive evaluation of high-temperature elastic modulus of 3C-SiC using Raman scattering

(4) Zhao, X a Yang, F a Zhang, H a Xiao, P a

a UNIVERSITY OF MANCHESTER (United Kingdom)

Author keywords

chemical vapor deposition; high temperature; modulus; Raman; SiC

Indexed keywords

CHEMICAL VAPOR DEPOSITION; ELASTIC MODULI; NONDESTRUCTIVE EXAMINATION; PHONONS; RAMAN SCATTERING;

BULK SAMPLES; CHEMICAL VAPOUR DEPOSITION; HIGHEST TEMPERATURE; LONGITUDINAL OPTICAL; MODULUS; NON DESTRUCTIVE EVALUATION; NONDESTRUCTIVE METHODS; RAMAN; SIC COATINGS; TEMPERATURE RANGE;

SILICON CARBIDE;

EID: 84864284464 PISSN: 03770486 EISSN: 10974555 Source Type: Journal
DOI: 10.1002/jrs.3119 Document Type: Article

Times cited : (13)

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