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Volumn , Issue , 2011, Pages 33-43

Ultra-thin wafer fabrication through dicing-by-thinning

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[No Author keywords available]

Indexed keywords


EID: 84864258340     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1007/978-1-4419-7276-7_4     Document Type: Chapter
Times cited : (12)

References (13)
  • 4
    • 33846594365 scopus 로고    scopus 로고
    • Investigations of the influence of dicing techniques on the strength properties of thin silicon
    • Schönfelder S, Ebert M, Landesberger C, Bock K, Bagdahn J (2007) Investigations of the influence of dicing techniques on the strength properties of thin silicon. Microelectron Reliab 47:168-178
    • (2007) Microelectron Reliab , vol.47 , pp. 168-178
    • Schönfelder, S.1    Ebert, M.2    Landesberger, C.3    Bock, K.4    Bagdahn, J.5
  • 5
    • 52649137389 scopus 로고    scopus 로고
    • Perfect chips: Chip-side-wall stress relief boosts stability
    • Heinze P, Amberger M, Chabert T (2008) Perfect chips: chip-side-wall stress relief boosts stability. Future Fab Int 25:111-117
    • (2008) Future Fab Int , vol.25 , pp. 111-117
    • Heinze, P.1    Amberger, M.2    Chabert, T.3
  • 13
    • 84892104655 scopus 로고    scopus 로고
    • Entwicklung eines Selbstmontage-Verfahrens (self-assembly) für die Systemintegration von sehr kleinen Silizium-Bausteinen
    • Fortschritt-Berichte VDI
    • Landesberger C (ed) (2010) Entwicklung eines Selbstmontage-Verfahrens (self-assembly) für die Systemintegration von sehr kleinen Silizium-Bausteinen. Abschlussbericht des BMBF Verbundvorhabens Assemble!, Fortschritt-Berichte VDI. 9 (386)
    • (2010) Abschlussbericht des BMBF Verbundvorhabens Assemble! , vol.9 , Issue.386
    • Landesberger, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.