Measurement of cluster-cluster interaction in liquids by deposition and AFM of silicon clusters onto HOPG surfaces: Height distributions of stacked layers as fingerprints of cluster-cluster interaction in solution

Journal of Nanoparticle Research

Volumn 14, Issue 8, 2012, Pages

  Galinis, Gediminas ^a   Torricelli, Gauthier ^a   Akraiam, Atea ^a   Von Haeften, Klaus ^a  

^a UNIVERSITY OF LEICESTER   (United Kingdom)

Author keywords

AFM; Cluster surface interaction; Clusters; HOPG; Nanoparticles in liquids; Silicon

Indexed keywords

ATOMIC FORCE MICROSCOPY; GRAPHITE; LIQUIDS; SILICON; SIZE DISTRIBUTION;

CLUSTER INTERACTIONS; CLUSTER-ASSEMBLED MATERIALS; CLUSTER-SURFACE INTERACTIONS; CLUSTERS; HEIGHT DISTRIBUTION; HIGHLY ORIENTED PYROLITIC GRAPHITES; HOPG; SILICON NANOCLUSTERS;

DEPOSITION;

GRAPHITE; HIGHLY ORIENTED PYROLITIC GRAPHITE; NANOPARTICLE; SILICON; UNCLASSIFIED DRUG; WATER;

AQUEOUS SOLUTION; ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL INTERACTION; CHEMICAL MODIFICATION; DISPERSION; PARTICLE SIZE; PRIORITY JOURNAL; SURFACE PROPERTY; WATER VAPOR;

EID: 84864186365     PISSN: 13880764     EISSN: 1572896X     Source Type: Journal    
DOI: 10.1007/s11051-012-1057-4     Document Type: Article

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