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Volumn , Issue , 2006, Pages 184-188

Measuring methods applicable to thermoelectric materials: Fraunhofer-IPM capabilities and services

Author keywords

[No Author keywords available]

Indexed keywords

CONTACTS (FLUID MECHANICS); DATA ACQUISITION; ELECTRIC CONDUCTIVITY; FILMS; HEAT STORAGE; MATERIALS HANDLING EQUIPMENT; MERGERS AND ACQUISITIONS; PERMANENT MAGNETS; RADAR STATIONS; SEEBECK COEFFICIENT; SOLIDS; THERMOELECTRIC EQUIPMENT; THICK FILMS; THIN FILMS;

EID: 46149083535     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICT.2006.331329     Document Type: Conference Paper
Times cited : (15)

References (11)
  • 2
    • 0000856591 scopus 로고
    • Heat transport in micron thick a-Si:H films
    • D.G. Cahill, M. Katiyar, J.R. Abelson, "Heat transport in micron thick a-Si:H films," Physical Review B, vol. 50, pp. 6077-6081, 1994.
    • (1994) Physical Review B , vol.50 , pp. 6077-6081
    • Cahill, D.G.1    Katiyar, M.2    Abelson, J.R.3
  • 3
    • 36549099049 scopus 로고
    • Thermal conductivity measurement from 30 to 750 K: The 3 omega method
    • D.G. Cahill, "Thermal conductivity measurement from 30 to 750 K: the 3 omega method," Review of Scientific Instrument, vol. 61, pp. 802-808, 1990.
    • (1990) Review of Scientific Instrument , vol.61 , pp. 802-808
    • Cahill, D.G.1
  • 4
    • 0035306385 scopus 로고    scopus 로고
    • Data reduction in 3omega method for thin-film thermal conductivity determination
    • T. Borca-Tasciuc, A.R. Kumar, G. Chen, "Data reduction in 3omega method for thin-film thermal conductivity determination," Review of Scientific Instruments, vol. 67, pp. 2139-2147, 2001.
    • (2001) Review of Scientific Instruments , vol.67 , pp. 2139-2147
    • Borca-Tasciuc, T.1    Kumar, A.R.2    Chen, G.3
  • 5
    • 0036537098 scopus 로고    scopus 로고
    • Numerical simulation of the 3omega method for measuring the thermal conductivity
    • A. Jacquot, B. Lenoir, A. Dauscher, M. Stolzer, J. Meusel, "Numerical simulation of the 3omega method for measuring the thermal conductivity," Journal of Applied Physics, vol. 91, pp. 4733-4738, 2002.
    • (2002) Journal of Applied Physics , vol.91 , pp. 4733-4738
    • Jacquot, A.1    Lenoir, B.2    Dauscher, A.3    Stolzer, M.4    Meusel, J.5
  • 7
    • 0000400594 scopus 로고
    • A Method of Measuring the Resistivity and Hall Coefficient on Lamellae and Arbitrary Shape
    • L. J. van der Pauw, "A Method of Measuring the Resistivity and Hall Coefficient on Lamellae and Arbitrary Shape," Philips Technical Review, vol. 20, pp. 220-224, 1958/1959.
    • (1958) Philips Technical Review , vol.20 , pp. 220-224
    • van der Pauw, L.J.1
  • 8
    • 18744378863 scopus 로고    scopus 로고
    • Experimental setup for the measurement of the electrical resistivity and thermopower of thin films and bulk materials
    • 1-4
    • O. Boffoué, A. Jacquot, A. Dauscher, and B. Lenoir, "Experimental setup for the measurement of the electrical resistivity and thermopower of thin films and bulk materials," Review of Scientific Instruments, vol. 76, pp. 053907 1-4, 2005.
    • (2005) Review of Scientific Instruments , vol.76 , pp. 053907
    • Boffoué, O.1    Jacquot, A.2    Dauscher, A.3    Lenoir, B.4
  • 9
    • 46149124275 scopus 로고    scopus 로고
    • - Approches to Thermoelectric Standardization
    • CRC Taylor & Francis ed. Boca Raton London New York
    • D. M. Rowe, "Chapter 26 - Approches to Thermoelectric Standardization," in Thermoelectrics Handbook - Macro to nano, CRC Taylor & Francis ed. Boca Raton London New York, 2005.
    • (2005) Thermoelectrics Handbook - Macro to nano
    • Rowe, D.M.1
  • 11
    • 0027680846 scopus 로고
    • Annealing-temperature dependence of the thermal conductivity of LPCVD silicon-dioxide layers
    • K.E.Goodson, M. I. Flik, L. T. Su, and D. A. Antoniadis, "Annealing-temperature dependence of the thermal conductivity of LPCVD silicon-dioxide layers," IEEE-Electron-Device-Letters, vol. 14, pp. 490-492, 1993.
    • (1993) IEEE-Electron-Device-Letters , vol.14 , pp. 490-492
    • Goodson, K.E.1    Flik, M.I.2    Su, L.T.3    Antoniadis, D.A.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.