Performance improvement in nanoparticle-assisted stimulated-emission- depletion nanoscopy

Applied Physics Letters

Volumn 101, Issue 2, 2012, Pages

  Sivan, Yonatan ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DECAY RATE; PERFORMANCE IMPROVEMENTS;

PHYSICAL PROPERTIES; PHYSICS;

DECAY (ORGANIC);

EID: 84863886240     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4735319     Document Type: Article

References (27)

1. S. Hell, Science 316, 1153 (2007). 10.1126/science.1137395
2. W. Moerner, Proc. Natl. Acad. Sci. U.S.A 104, 12596 (2207). 10.1073/pnas.0610081104
3. S. Hell and J. Wichmann, Opt. Lett. 19, 780 (1994). 10.1364/OL.19.000780
4. T. Klar, S. Jakobs, M. Dyba, A. Egner, and S. Hell, Proc. Natl. Acad. Sci. U.S.A 97, 8206 (2000). 10.1073/pnas.97.15.8206
5. P. Török and P. Munro, Opt. Express 12, 3605 (2004). 10.1364/OPEX.12.003605
6. G. Donnert, J. Keller, R. Medda, M. Andrei, S. Rizzoli, R. Luhrman, R. Jahn, C. Eggeling, and S. Hell, Proc. Natl. Acad. Sci. U.S.A 103, 11440 (2006). 10.1073/pnas.0604965103
7. M. Leutenegger, C. Eggeling, and S. Hell, Opt. Express 18, 26417 (2010). 10.1364/OE.18.026417
8. K. Willig, B. Harke, R. Medda, and S. Hell, Nat. Methods 4, 915 (2007). 10.1038/nmeth1108
9. E. Auksorius, B. Boruah, C. Dunsby, P. Lanigan, G. Kennedy, M. Neil, and P. French, Opt. Lett. 33, 113 (2008). 10.1364/OL.33.000113
10. J. Moffitt, C. Osseforth, and J. Michaelis, Opt. Express 19, 4242 (2011). 10.1364/OE.19.004242
11. G. Vicidomini, G. Moneron, K. Han, V. Westphal, H. Ta, M. Reuss, J. Engelhardt, C. Eggeling, and S. Hell, Nat. Methods 8, 571 (2011). 10.1038/nmeth.1624
12. S. Schrof, T. Staudt, E. Rittweger, N. Wittenmayer, T. Dresbach, J. Engelhardt, and S. Hell, Opt. Express 19, 8066 (2011). 10.1364/OE.19.008066
13. Y. Sivan, Y. Sonnefraud, S. Kéna-Cohen, J. Pendry, and S. Maier, ACS Nano 6, 5291 (2012). 10.1021/nn301082g
14. F. Balzarotti and F. Stefani, ACS Nano 6, 4580 (2012). 10.1021/nn302306m
15. J. Enderlein, Appl. Phys. Lett. 80, 315 (2002). 10.1063/1.1434314
16. J. Enderlein, Phys. Chem. Chem. Phys. 4, 2780 (2002). 10.1039/b200502f
17. S. Kéna-Cohen, A. Wiener, Y. Sivan, P. Stavrinou, D. Bradley, A. Horsefield, and S. Maier, ACS Nano 5, 9958 (2011). 10.1021/nn203754v
18. Note that for a non-ideal emitter for which the quantum yield is lower than 100, the total spontaneous decay consists of contributions from both radiative and non-radiative decay channels.
19. M. Foreman, Y. Sivan, S. A. Maier, and P. Török, Illumination-dependence of plasmonic near-field enhancements., J. Opt. Sco. Am. A (submitted).
20. In that regard, we should note that while the condition 1 / T STED k vib mentioned above holds in general, the decay rate enhancement induced by the metal may, in principle, put the validity of the second condition, k S 1 k vib, in question. However, the spectral scheme in NP-STED, whereby the plasmon resonance of the metal NP is tuned to the depletion wavelength, minimizes the decay rate enhancement at the emission wavelength. Consequently, the second condition should hold in NP-STED as well. In cases where the decay rate enhancement is even more significant, one should use a more general expression for the depletion efficiency (Ref.).
21. D. Wildanger, E. Rittweger, L. Kastrup, and S. Hell, Opt. Express 16, 9614 (2008). 10.1364/OE.16.009614
22. S. Maier, Plasmonics: Fundamentals and Applications (Springer, 2007).
23. M. Bruchez, M. Moronne, P. Gin, S. Weiss, and A. Alivisatos, Science 281, 2013 (1998). 10.1126/science.281.5385.2013
24. A. Burns, H. Ow, and U. Wiesner, Chem. Soc. Rev. 35, 1028 (2006). 10.1039/b600562b
25. O. Faklaris, V. Joshi, T. Irinopoulou, P. Tauc, M. Sennour, H. Girard, C. Gesset, J.-C. Arnault, A. Thorel, J.-P. Boudou, P. Curmi, and F. Treussart, ACS Nano 3, 3955 (2009). 10.1021/nn901014j
26. C. Fu, H. Lee, K. Chen, T. Lim, H. Wu, P. Lin, P. Wei, P. Tsao, H. Chang, and W. Fann, Proc. Natl. Acad. Sci. U.S.A. 104, 727 (2007). 10.1073/pnas.0605409104
27. K. Han, K. Willig, E. Rittweger, F. Jelezko, C. Eggeling, and S. Hell, Nano Lett. 9, 3323 (2009). 10.1021/nl901597v