The noise-limited-resolution for stimulated emission depletion microscopy of diffusing particles

Optics Express

Volumn 20, Issue 12, 2012, Pages 12793-12798

  Lee, Chris J ^a,b   Boller, Klaus J ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b FOM INSTITUTE DIFFER   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL CONSTANTS; OPTICS;

DIFFRACTION LIMITS; DIFFUSING PARTICLES; DIFFUSIVE REGIME; EXCITED-STATE LIFETIME; FAR-FIELD IMAGING; FLUORESCENT LABELS; NOISE-LIMITED RESOLUTION; SATURATION INTENSITY; SIGNAL INTEGRATION; STIMULATED EMISSION DEPLETION MICROSCOPY; THERMAL MOTION;

DIFFRACTION;

EID: 84863753324     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.012793     Document Type: Article

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