Giant dielectric constant and good temperature stability in Y 2/3Cu 3Ti4O 12ceramics

Journal of the American Ceramic Society

Volumn 95, Issue 7, 2012, Pages 2218-2225

  Liang, Pengfei ^a   Yang, Zupei ^a   Chao, Xiaolian ^a   Liu, Zonghuai ^a  

^a SHAANXI NORMAL UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX IMPEDANCE SPECTROSCOPY; GIANT DIELECTRIC CONSTANTS; GIANT PERMITTIVITY; INTERNAL BARRIER LAYER CAPACITANCE EFFECTS; LOW DIELECTRIC LOSS; RC ELEMENTS; ROOM TEMPERATURE; SEMICONDUCTING GRAINS; SINTERING CONDITION; SOLID STATE REACTION METHOD; TEMPERATURE RANGE; TEMPERATURE STABILITY;

DIELECTRIC LOSSES; GRAIN BOUNDARIES; PHASE STRUCTURE; SINTERING; SOLID STATE REACTIONS;

CERAMIC MATERIALS;

EID: 84863717101     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2012.05152.x     Document Type: Article

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