In-situ characterization of free-volume holes in polymer thin films under controlled humidity conditions with an atmospheric positron probe microanalyzer

Applied Physics Letters

Volumn 101, Issue 1, 2012, Pages

  Zhou, Wei ^a   Chen, Zhe ^b,e   Oshima, Nagayasu ^a   Ito, Kenji ^b   O'Rourke, Brian E ^a   Kuroda, Ryunosuke ^a   Suzuki, Ryoichi ^a   Yanagishita, Hiroshi ^a   Tsutsui, Takuro ^c   Uedono, Akira ^c   Hayashizaki, Noriyosu ^d  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^c UNIVERSITY OF TSUKUBA   (Japan)

^d TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^e WUHAN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CHAIN MOBILITY; EFFECT OF WATER; HOLE SIZE; HUMIDITY CONDITIONS; IN-SITU CHARACTERIZATION; MICROANALYZERS; ORTHO-POSITRONIUM LIFETIME; POLYCAPROLACTAM; POLYMER THIN FILMS; SLOW POSITRON BEAM;

HOLE MOBILITY; POSITRONS; PROBES; SILICON NITRIDE; THICK FILMS;

ATMOSPHERIC HUMIDITY;

EID: 84863713466     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4729425     Document Type: Article

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