Rapid three-dimensional imaging of defect distributions using a high-intensity positron microbeam

Applied Physics Letters

Volumn 94, Issue 19, 2009, Pages

  Oshima, N ^a   Suzuki, R ^a   Ohdaira, T ^a   Kinomura, A ^a   Narumi, T ^b   Uedono, A ^b   Fujinami, M ^c  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b UNIVERSITY OF TSUKUBA   (Japan)

^c CHIBA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM DIAMETERS; COUNTING RATES; DEFECT DISTRIBUTION; ELECTRON ACCELERATOR; MICRO BEAMS; POSITRON LIFETIME; SINGLE IMAGES; THREE DIMENSIONAL IMAGING; VISUAL EVALUATION;

IMAGING SYSTEMS; POSITRONS; THREE DIMENSIONAL;

ELECTRONS;

EID: 67049099151     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3137188     Document Type: Article

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