SCOPUS 정보 검색 플랫폼

Volumn 87, Issue 6, 2001, Pages 674021-674024

Lifetime measurements with a scanning positron microscope

(4) David, A a Kogel G a Sperr, P a Triftshauser W a

a BUNDESWEHR UNIVERSITY MUNICH (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; ELECTRON MICROSCOPY; KINETIC ENERGY; LASER BEAM EFFECTS; RADIOISOTOPES; SCANNING; SEMICONDUCTING GALLIUM ARSENIDE; SPECTROSCOPIC ANALYSIS; SURFACE TREATMENT;

SCANNING POSITRON MICROSCOPES;

POSITRONS;

EID: 0035817086 PISSN: 00319007 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (86)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.