Software controlled cell bit-density to improve NAND flash lifetime

Proceedings - Design Automation Conference

Volumn , Issue , 2012, Pages 229-234

  Jimenez, Xavier ^a   Novo, David ^a   Ienne, Paolo ^a  

^a EPFL   (Switzerland)

Author keywords

flash endurance; FTL; MLC; NAND flash memory; SLC

Indexed keywords

DEVICE LIFETIME; FLASH TRANSLATION LAYER; FTL; LIFETIME IMPROVEMENT; MLC; MULTILEVEL CELL; NAND FLASH; NAND FLASH MEMORY; PERFORMANCE IMPROVEMENTS; SINGLE LEVEL; SLC; STATE OF THE ART;

COMPUTER AIDED DESIGN;

FLASH MEMORY;

EID: 84863541715     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/2228360.2228404     Document Type: Conference Paper

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