In situ TEM investigations on thermoelectric Bi 2Te 3/Sb 2Te 3 multilayers

Advanced Engineering Materials

Volumn 14, Issue 3, 2012, Pages 139-143

  Schürmann, Ulrich ^a   Winkler, Markus ^b   König, Jan D ^b   Liu, Xi ^a   Duppel, Viola ^c   Bensch, Wolfgang ^a   Böttner, Harald ^b   Kienle, Lorenz ^a  

^a UNIVERSITY OF KIEL   (Germany)

^b FRAUNHOFER INSTITUTE FOR PHYSICAL MEASUREMENT TECHNIQUES IPM   (Germany)

^c MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION TECHNIQUE; ELEMENTAL MAPPING; EX SITU; FOCUSED ION BEAM TECHNIQUE; HEATING UP; HIGH-ANGLE ANNULAR DARK FIELDS; HIGH-RESOLUTION TEM; IN-SITU; IN-SITU TEM; LATTICE PLANE; LAYER STRUCTURES; NANOALLOYING; REAL STRUCTURE; TRANSMISSION ELECTRON MICROSCOPE;

ANTIMONY; CRYSTALLITES; CRYSTALLOGRAPHY; GRAIN GROWTH; HEAT TREATMENT; MOLECULAR BEAM EPITAXY; MULTILAYERS; SOLIDS; TRANSMISSION ELECTRON MICROSCOPY; TWINNING;

BISMUTH;

EID: 84863249278     PISSN: 14381656     EISSN: 15272648     Source Type: Journal    
DOI: 10.1002/adem.201100209     Document Type: Conference Paper

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