Influence of polymer dielectric surface energy on thin-film transistor performance of solution-processed triethylsilylethynyl anthradithiophene (TES-ADT)

Physica Status Solidi - Rapid Research Letters

Volumn 6, Issue 2, 2012, Pages 71-73

  Chen, Liang Hsiang ^a   Lin, Pang ^a   Kim, Choongik ^b   Chen, Ming Chou ^c   Huang, Peng Yi ^c   Ho, Jia Chong ^d   Lee, Cheng Chung ^d  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b Sogang University   (South Korea)

^c NATIONAL CENTRAL UNIVERSITY   (Taiwan)

^d INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

Author keywords

Dielectric materials; Organic thin film transistors; Polymers; Surface energy; Triethylsilylethynyl anthradithiophene

Indexed keywords

BIAS STRESS; ELECTRICAL PERFORMANCE; FILM MORPHOLOGY; HIGH STABILITY; HIGH SURFACE ENERGY; LARGE-GRAIN; LOW SURFACE ENERGY; ON/OFF RATIO; ORGANIC THIN FILM TRANSISTORS; POLYMER DIELECTRICS; SOLUTION-PROCESSED; SURFACE ENERGIES; TRIETHYLSILYLETHYNYL ANTHRADITHIOPHENE; X RAY REFLECTION;

CARRIER MOBILITY; DIELECTRIC DEVICES; INTERFACIAL ENERGY; PHENOLS; POLYIMIDES; POLYMER FILMS; POLYMERS; SEMICONDUCTING ORGANIC COMPOUNDS; SURFACE CHEMISTRY; SURFACES; THIN FILM TRANSISTORS; TRANSISTORS;

DIELECTRIC MATERIALS;

EID: 84863032566     PISSN: 18626254     EISSN: 18626270     Source Type: Journal    
DOI: 10.1002/pssr.201105534     Document Type: Article

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