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Optics Letters

Volumn 37, Issue 3, 2012, Pages 305-307

Longitudinal-differential interferometry: Direct imaging of axial superluminal phase propagation

(5) Kim, Myun Sik a,b Scharf, Toralf a,b Etrich, Christoph a,b Rockstuhl, Carsten a,b Peter, Hans Herzig a,b

a EPFL (Switzerland)

b FRIEDRICH SCHILLER UNIVERSITY JENA (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIRECT IMAGING; FIELD DISTRIBUTION; HIGH RESOLUTION; INTERFERENCE MICROSCOPES; INTERFEROMETRIC METHODS; LIGHT INTERACTION; PHASE DELAY; PHASE DIFFERENCE; PHASE PROPAGATION; PHOTONIC NANOJETS; SCATTERED FIELD; SPATIALLY RESOLVED; SUPERLUMINAL;

NUMBERING SYSTEMS;

INTERFEROMETRY;

EID: 84863012844 PISSN: 01469592 EISSN: 15394794 Source Type: Journal
DOI: 10.1364/OL.37.000305 Document Type: Article

Times cited : (16)

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