Effect of buffer layer thickness on the growth properties of hydrothermally grown ZnO nanorods

Journal of Nanoscience and Nanotechnology

Volumn 11, Issue 2, 2011, Pages 1409-1412

  Kim, Ah Ra ^a   Lee, Ju Young ^a   Jang, Bo Ra ^a   Kim, Hong Seung ^a   Cho, Young Ji ^a   Park, Hyun Kook ^a   Jang, Nak Won ^a   Kim, Jin Hyeok ^b  

^a Korea Maritime University   (South Korea)

^b Chonnam National University   (South Korea)

Author keywords

Buffer layer thickness; Hydrothermal process; ZnO nanorod

Indexed keywords

BUFFER LAYER THICKNESS; COSPUTTERING; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; GROWTH PROPERTIES; HYDROTHERMAL PROCESS; HYDROTHERMALLY; STRUCTURAL AND OPTICAL PROPERTIES; ZNO BUFFER LAYER; ZNO NANOROD;

ANNEALING; BUFFER LAYERS; NANORODS; OPTICAL PROPERTIES; OPTICAL WAVEGUIDES; X RAY DIFFRACTION;

ZINC OXIDE;

EID: 84863011175     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2011.3395     Document Type: Conference Paper

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