A 65 nm CMOS digital phase imager for time-resolved fluorescence imaging

IEEE Journal of Solid-State Circuits

Volumn 47, Issue 7, 2012, Pages 1731-1742

  Guo, Jian ^a   Sonkusale, Sameer ^a  

^a Tufts University   (United States)

Author keywords

CMOS image sensor; fluorescence; fluorescence lifetime imaging microscopy (FLIM); imager; luminescence; phase contrast imaging; time interpolation; time to digital converter (TDC); zero crossing detection

Indexed keywords

CMOS IMAGE SENSOR; FLUORESCENCE LIFETIME IMAGING MICROSCOPY; IMAGER; PHASE-CONTRAST IMAGING; TIME INTERPOLATION; TIME TO DIGITAL CONVERTERS; ZERO-CROSSING DETECTION;

CMOS INTEGRATED CIRCUITS; DIGITAL CAMERAS; FLUORESCENCE; FREQUENCY CONVERTERS; IMAGE RECONSTRUCTION; LUMINESCENCE; PHASE SHIFT; TIME DELAY;

SIGNAL DETECTION;

EID: 84862980555     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2012.2191335     Document Type: Article

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