Degradation modeling and monitoring of truncated degradation signals

IIE Transactions (Institute of Industrial Engineers)

Volumn 44, Issue 9, 2012, Pages 793-803

  Zhou, Rensheng ^a   Gebraeel, Nagi ^a   Serban, Nicoleta ^a  

^a Georgia Institute of Technology   (United States)

Author keywords

Bayesian updating; functional data analysis; Residual life

Indexed keywords

BAYESIAN UPDATING; DATA SPARSITY; DEGRADATION MODELING; DEGRADED SYSTEM; ENGINEERING SYSTEMS; FAILURE THRESHOLDS; FUNCTIONAL DATA ANALYSIS; FUNCTIONAL FORMS; HISTORICAL DATA; IN-SITU; MONITORING TECHNIQUES; NON-PARAMETRIC; NON-PARAMETRIC MODEL; PARAMETRIC DEGRADATION; RESIDUAL LIFE; RESIDUAL LIFE DISTRIBUTION; SENSOR TECHNOLOGIES; SIGNAL TRANSFORMATION; SPARSE SIGNALS; TIME INTERVAL;

CONDITION MONITORING; SENSORS;

DEGRADATION;

EID: 84862891858     PISSN: 0740817X     EISSN: 15458830     Source Type: Journal    
DOI: 10.1080/0740817X.2011.618175     Document Type: Article

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