A local learning based Image-To-Class distance for image classification

1st Asian Conference on Pattern Recognition, ACPR 2011

Volumn , Issue , 2011, Pages 667-671

  Cai, Xinyuan ^a   Xiao, Baihua ^a   Wang, Chunheng ^a   Zhang, Rongguo ^a  

^a INSTITUTE OF AUTOMATION   (China)

Author keywords

image classification; image to class distance; large margin metric learning; local learning; Na ve Bayes Nearest Neighbor

Indexed keywords

BENCHMARK DATASETS; CALTECH; CLASSIFICATION ACCURACY; DATA SETS; FEATURE-BASED; IMAGE CLASSIFIERS; IMAGE-TO-CLASS DISTANCE; LOCAL LEARNING; MAHALANOBIS METRIC; METRIC LEARNING; NEAREST-NEIGHBORS; TRAINING SAMPLE;

IMAGE CLASSIFICATION; PATTERN RECOGNITION; SAMPLING;

DATA PROCESSING;

EID: 84862836280     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ACPR.2011.6166577     Document Type: Conference Paper

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