Nanocrystalline SnO 2TiO 2 thin film deposited on base of equilateral prism as an opto-electronic humidity sensor

Optics and Laser Technology

Volumn 44, Issue 6, 2012, Pages 1681-1688

  Yadav, B C ^a,b   Verma, Nidhi ^a   Singh, Satyendra ^a  

^a UNIVERSITY OF LUCKNOW   (India)

^b BABASAHEB BHIMRAO AMBEDKAR UNIVERSITY   (India)

Author keywords

Opto electronic humidity sensor; Thin film; XRD

Indexed keywords

CAMBRIDGE; CHEMICAL IMPURITIES; DIFFERENTIAL SCANNING CALORIMETRIES (DSC); DIGITAL POWER METERS; EXOTHERMIC PEAKS; INTENSITY OF LIGHT; MAXIMUM SENSITIVITY; NANOCRYSTALLINES; SCANNING ELECTRON MICROSCOPE; SEM IMAGE; SENSOR FABRICATION; SYNTHESIZED MATERIALS; TIO; XRD;

DIFFERENTIAL SCANNING CALORIMETRY; HUMIDITY SENSORS; PRISMS; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TITANIUM DIOXIDE; X RAY DIFFRACTION;

FILM PREPARATION;

EID: 84862819049     PISSN: 00303992     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optlastec.2011.12.041     Document Type: Article

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