The dedicated high-resolution grazing-incidence X-ray scattering beamline 8-ID-E at the Advanced Photon Source

Journal of Synchrotron Radiation

Volumn 19, Issue 4, 2012, Pages 627-636

  Jiang, Zhang ^a   Li, Xuefa ^a,b   Strzalka, Joseph ^a   Sprung, Michael ^a,c   Sun, Tao ^a   Sandy, Alec R ^a   Narayanan, Suresh ^a   Lee, Dong Ryeol ^a,d   Wang, Jin ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b CELGARD LLC   (United States)

^c DESY   (Germany)

^d Soongsil University   (South Korea)

Author keywords

beamline; coherence; grazing incidence; high resolution; X ray scattering

Indexed keywords

ADVANCED PHOTON SOURCE; BEAM LINES; GRAZING INCIDENCE; GRAZING-INCIDENCE X-RAY SCATTERING; HIGH RESOLUTION; IN-SITU; LIQUID SURFACE; NANOSTRUCTURED THIN FILM; REAL-TIME STUDIES; SCATTERING TECHNIQUES; SURFACES AND INTERFACES; X RAY PHOTON CORRELATION SPECTROSCOPY;

COHERENT LIGHT; DESIGN; ELEMENTARY PARTICLE SOURCES; EXPERIMENTS; PHOTON CORRELATION SPECTROSCOPY; X RAYS;

COHERENT SCATTERING;

EID: 84862676993     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049512022017     Document Type: Article

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