Interfacial defects distribution and strain coupling in the vertically aligned nanocomposite YBa 2Cu 3O 7-X/BaSnO 3 thin films

Journal of Materials Research

Volumn 27, Issue 13, 2012, Pages 1763-1769

  Zhu, Yuanyuan ^a   Tsai, Chen Fong ^a   Wang, Jie ^a   Kwon, Ji Heon ^a   Wang, Haiyan ^a   Varanasi, Chakrapani V ^b   Burke, Jack ^b   Brunke, Lyle ^b   Barnes, Paul N ^c  

^a Department of Electrical and Computer Engineering   (United States)

^b UNIVERSITY OF DAYTON RESEARCH INSTITUTE   (United States)

^c AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

nanostructure; stress strain relationship; superconducting

Indexed keywords

DOPING CONCENTRATION; GEOMETRIC PHASE ANALYSIS; HETEROGENEOUS INTERFACES; HIGH-DENSITY ARRAYS; INTERFACIAL DEFECT; LATTICE STRAIN; MICROSTRUCTURAL CHARACTERISTICS; NANOCOMPOSITE THIN FILMS; NANOPILLAR; NANOPILLARS; SECONDARY PHASE; SELF-ASSEMBLED; STRAIN STATE; STRESS/STRAIN; SUPERCONDUCTING; VERTICALLY ALIGNED;

INTERFACES (MATERIALS); NANOSTRUCTURES; SEMICONDUCTOR DOPING; SUBSTRATES; SUPERCONDUCTIVITY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; YTTRIUM BARIUM COPPER OXIDES;

STRAIN;

EID: 84862571043     PISSN: 08842914     EISSN: 20445326     Source Type: Journal    
DOI: 10.1557/jmr.2012.125     Document Type: Article

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