Interfacial defects and flux-pinning effects in nanostructured yba2cu 3o7&gama; thin films

IEEE Transactions on Applied Superconductivity

Volumn 19, Issue 3, 2009, Pages 3395-3398

  Wang, Haiyan ^a   Wang, Jie ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

Critical current density; Nanolayer; Pinning prop erties; YBCO

Indexed keywords

CROSS-SECTION TRANSMISSION ELECTRON MICROSCOPIES; DOPING MATERIALS; HIGH-RESOLUTION TEM; INTERFACIAL DEFECT; MISFIT DISLOCATIONS; NANO-STRUCTURED; NANOLAYER; PINNING PROP ERTIES; PULSED-LASER DEPOSITION TECHNIQUE; SECONDARY PHASIS; SUPERCONDUCTING PROPERTIES; TEM; YBCO;

DEFECTS; FLUX PINNING; PULSED LASER DEPOSITION; THIN FILMS; YTTRIUM BARIUM COPPER OXIDES;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 68649116218     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2009.2018282     Document Type: Conference Paper

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