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Volumn 45, Issue 26, 2012, Pages

Ferroelectric domain configurations in 0.65Pb(Mg 1/3Nb 2/3)O 30.35PbTiO 3 thick films determined by piezoresponse force microscopy

(6) Ursic H a,b Ricote, J a Amorin H a Holc, J b Kosec, M b Alguero M a

a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID (Spain)

b JO EF STEFAN INSTITUTE (Slovenia)

Author keywords

[No Author keywords available]

Indexed keywords

BULK CERAMICS; CHARACTERISTIC LENGTH; DOMAIN CONFIGURATIONS; ELECTROMECHANICAL RESPONSE; FERROELECTRIC DOMAIN CONFIGURATIONS; FERROELECTRIC POLARIZATION; FERROELECTRIC TRANSITION; FILM STRESS; GRAIN SIZE; IN-PLANE COMPONENTS; IN-PLANE POLARIZATION; NANO SCALE; OUT-OF-PLANE; PB(ZR , TI)O; PIEZORESPONSE FORCE MICROSCOPY; POLAR NANODOMAINS; RELAXORS;

ELECTRIC FIELDS; FERROELECTRIC CERAMICS; FERROELECTRIC MATERIALS; GRAIN BOUNDARIES; LEAD; NANOTECHNOLOGY; POLARIZATION; SUBSTRATES; THICK FILMS; ZIRCONIUM;

FERROELECTRICITY;

EID: 84862569082 PISSN: 00223727 EISSN: 13616463 Source Type: Journal
DOI: 10.1088/0022-3727/45/26/265402 Document Type: Article

Times cited : (9)

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