Rapid detection of pesticide residue in apple based on Raman spectroscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8369, Issue , 2012, Pages

  Li, Yongyu ^a   Sun, Yunyun ^a   Peng, Yankun ^a   Dhakal, Sagar ^a   Chao, Kuanglin ^b   Liu, Qiaoqiao ^a  

^a CHINA AGRICULTURAL UNIVERSITY   (China)

^b AGRICULTURAL RESEARCH SERVICE   (United States)

Author keywords

fruit; pesticide residue; Raman spectroscopy; rapid non destructive testing

Indexed keywords

ALUMINUM SUBSTRATE; APPLE FRUITS; CHARACTERISTIC PEAKS; CHLORPYRIFOS; COMMERCIAL PRODUCTS; COMPARATIVE ANALYSIS; CONCENTRATION RANGES; DISTILLED WATER; LIMIT OF DETECTION; LOW CONCENTRATIONS; NON DESTRUCTIVE TESTING; ORGANIC CONTAMINANT; ORGANOPHOSPHORUS PESTICIDE; PESTICIDE RESIDUE; RAMAN INTENSITIES; RAPID DETECTION;

AGRICULTURE; NONDESTRUCTIVE EXAMINATION; PESTICIDES; RAMAN SCATTERING; RAMAN SPECTROSCOPY;

FRUITS;

EID: 84862528565     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.918527     Document Type: Conference Paper

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